2026.11.09

5-13. Reliability Engineering

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• Semiconductors
• Advanced Process Nodes
• Copper Interconnects
• Electromigration
• Gate Dielectric
• Reliability Testing

2026.11.09

5-7. Low-k / Ultra Low-k Materials and Multilayer Interconnect Technology

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• Semiconductors
• Low-k Dielectrics
• Advanced Process Nodes
• Copper Interconnects
• Front-End Process
• Multilayer Interconnects
• RC Delay

2026.08.05

4-9. Wiring Formation (Metallization)

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• Semiconductors
• Low-k Dielectrics
• BEOL
• Copper Interconnects
• Damascene Process
• Front-End Process
• Semiconductor Manufacturing Process

2026.08.04

4-8. CMP (Chemical Mechanical Polishing)

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• Semiconductors
• CMP (Chemical Mechanical Polishing)
• Copper Interconnects
• Front-End Process
• Planarization
• Semiconductor Equipment Technology
• Semiconductor Manufacturing Process