2026.11.10 7-3. Final Electrical Test (Final Test / FT) ... Read More Semiconductors ATE (Automatic Test Equipment) Final Test Functional Test Inspection and Characterization Known Good Die (KGD) Semiconductor Testing
2026.11.09 6-12. Volume Production Challenges and Yield (Package Yield & Cost Structure) ... Read More Semiconductors Back-End Process Known Good Die (KGD) Package Yield Semiconductor Packaging Volume Production Challenges Yield Improvement
