2026.11.10

7-10. Burn-in and Lifetime Testing (Burn-in & Lifetime Testing)

... Read More

• Semiconductors
• Burn-In Test
• Final Test
• Inspection and Characterization
• Lifetime Testing
• Reliability Testing
• Thermal Cycling Test

2026.11.10

7-7. Electrical Characterization (DC / RF / High-Speed Signals)

... Read More

• Semiconductors
• Final Test
• Inspection and Characterization
• Parametric Testing
• RF Measurement
• Semiconductor Characterization
• Signal and Power Integrity (SI/PI)

2026.11.10

7-3. Final Electrical Test (Final Test / FT)

... Read More

• Semiconductors
• ATE (Automatic Test Equipment)
• Final Test
• Functional Test
• Inspection and Characterization
• Known Good Die (KGD)
• Semiconductor Testing

2026.08.05

4-13. Final Test (E-Test / FT)

... Read More

• Semiconductors
• ATE (Automatic Test Equipment)
• Final Test
• Probe Testing
• Semiconductor Manufacturing Process
• Semiconductor Testing
• Yield Improvement