2026.11.10

7-14. Summary of Inspection and Characterization Technology and Learning Objectives

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• Semiconductors
• Failure Analysis
• Inspection and Characterization
• Quality Assurance
• Semiconductor Characterization
• Semiconductor Testing
• Semiconductor Quality Control

2026.11.10

7-8. Signal and Power Noise Analysis (SI / PI)

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• Semiconductors
• EMC
• High-Speed Signal Design
• Inspection and Characterization
• Noise Suppression
• Semiconductor Characterization
• Signal and Power Integrity (SI/PI)

2026.11.10

7-7. Electrical Characterization (DC / RF / High-Speed Signals)

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• Semiconductors
• Final Test
• Inspection and Characterization
• Parametric Testing
• RF Measurement
• Semiconductor Characterization
• Signal and Power Integrity (SI/PI)

2026.11.09

Chapter 7: Inspection & Characterization
7-1. The Role and Overall Picture of Inspection and Characterization Technology

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• Semiconductors
• Inspection and Characterization
• Quality Assurance
• Semiconductor Characterization
• Semiconductor Testing
• Semiconductor Quality Control
• Yield Improvement