2026.11.13

10-2. Microfabrication (Part 2) ― Not a Technology for Making Things Small, but a Technology for Establishing Small Functions ―

In Part 1, we looked at how to make fine shapes. Narrow TIM. Graphite heat path... Read More

• Thermal Management Components
• Automatic Application Machines
• Thermal Interface Materials (TIM)
• Inspection and Characterization
• Particle Control
• Reel Supply
• Microfabrication

2026.11.13

Chapter 10: What OTIS Can Do ― As a Company That Makes Heat Problems Work in Volume Production
10-1. High-Precision Die-Cutting (Part 2) ― The First Technology That Turns Thermal Management Materials into “Usable Components” ―

In Part 1, we saw that processing accuracy connects directly to thermal performa... Read More

• Thermal Management Components
• Inspection and Characterization
• Yield Improvement
• Process Design and Manufacturing Quality
• Reel Supply
• Burr Control
• Half-Cut Processing

2026.11.10

7-14. Summary of Inspection and Characterization Technology and Learning Objectives

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• Semiconductors
• Failure Analysis
• Inspection and Characterization
• Quality Assurance
• Semiconductor Characterization
• Semiconductor Testing
• Semiconductor Quality Control

2026.11.10

7-13. Yield Data Analytics and Statistical Quality Control (Yield Data Analytics & SPC)

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• Semiconductors
• AI in Manufacturing
• Big Data Analytics
• Inspection Data Analytics
• Inspection and Characterization
• Statistical Process Control (SPC)
• Yield Improvement

2026.11.10

7-12. Reliability Evaluation

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• Semiconductors
• Accelerated Life Testing
• Inspection and Characterization
• JEDEC Standards
• Reliability Testing
• Semiconductor Quality Control
• Thermal Cycling Test

2026.11.10

7-11. Failure Analysis

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• Semiconductors
• Defect Analysis
• Inspection and Characterization
• Root Cause Analysis
• SEM / TEM Analysis
• Semiconductor Failure Analysis
• Semiconductor Quality Control