2026.11.10

7-4. Visual Inspection (Optical Inspection)

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• Semiconductors
• Automated Optical Inspection (AOI)
• Defect Inspection
• Inspection and Characterization
• Machine Vision
• Semiconductor Testing
• Yield Improvement

2026.11.10

7-3. Final Electrical Test (Final Test / FT)

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• Semiconductors
• ATE (Automatic Test Equipment)
• Final Test
• Functional Test
• Inspection and Characterization
• Known Good Die (KGD)
• Semiconductor Testing

2026.11.09

7-2. Wafer-Level Electrical Characteristic Testing (Wafer Electrical Test / E-Test)

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• Semiconductors
• Silicon Wafers
• ATE (Automatic Test Equipment)
• Inspection and Characterization
• Process Control Monitor (PCM)
• Semiconductor Testing
• Wafer Test

2026.11.09

Chapter 7: Inspection & Characterization
7-1. The Role and Overall Picture of Inspection and Characterization Technology

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• Semiconductors
• Inspection and Characterization
• Quality Assurance
• Semiconductor Characterization
• Semiconductor Testing
• Semiconductor Quality Control
• Yield Improvement