2026.11.10 7-3. Final Electrical Test (Final Test / FT) ... Read More Semiconductors ATE (Automatic Test Equipment) Final Test Functional Test Inspection and Characterization Known Good Die (KGD) Semiconductor Testing
2026.11.09 7-2. Wafer-Level Electrical Characteristic Testing (Wafer Electrical Test / E-Test) ... Read More Semiconductors Silicon Wafers ATE (Automatic Test Equipment) Inspection and Characterization Process Control Monitor (PCM) Semiconductor Testing Wafer Test
2026.08.05 4-13. Final Test (E-Test / FT) ... Read More Semiconductors ATE (Automatic Test Equipment) Final Test Probe Testing Semiconductor Manufacturing Process Semiconductor Testing Yield Improvement
